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Microelectronics, electromagnetism, photonics , microwave

> Platforms > Physical and electrical characterization > Measurements of the transport properties

Measurements of the transport properties

At room temperature, we're able to characterize on-wafer directly thanks to:
  • A manual probe test bench for resistivity and Hall effect measurement
Concerning the low temperature measurements, two possibilities:
  • A cryostat for Hall effect measurement on DIL packaged samples (15K->400K and Bmax=0.85 T).  
  • A test bench for Hall effect measurement, plus the possibility to get magnetic-resistance measurements thanks to a high applied magnetic field (up to 9T) on PLCC (24 pin) packaged devices. (Temperature range: from 2K up to 400K).
Hall effect measurement, Hall effect measurement

Date of update May 17, 2019

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